US Patent:
20170234746, Aug 17, 2017
Inventors:
- New York NY, US
Wayne L. Nemeth - Rye NY, US
Michael A. Brody - Philadelphia PA, US
Lev M. Barsky - New York NY, US
Assignee:
T+Ink, Inc. - New York NY
International Classification:
G01L 1/20
G01L 25/00
Abstract:
A method of reading and quantifying pressure points or bumps or a product outline to extract a pattern that, when decoded, uniquely defines a product or class of products by defining the theoretical centers of applied pressure, determining the spatial relationship between more than one center or a product outline to define which pattern belongs to which product, and correlating each pattern with templates of stored patterns to determine what product is represented by each respective pattern.