Wayne A. Branagh - Omaha NE Robert C. Fry - Omaha NE Juan C. Ivaldi - Foster City CA Jason A. Rivers - Omaha NE Michael R. Dyas - Omaha NE
Assignee:
SD Acquisition Inc. - Omaha NE
International Classification:
G01J 318
US Classification:
356 72, 356328, 700121
Abstract:
Disclosed is a spectrometer system with unique wavelength resolution improving relative positioning of diffraction grating and detector. Also disclosed is a modified evolving windowed factor analysis based method of detecting semiconductor etch end points which is particularly well suited for use in real time monitoring and process control. Use of wavelength group selecting mask filters is also disclosed.