Resumes
Resumes
Vince Butsumyo
View pageLocation:
San Diego, CA
Vince Butsumyo Phones & Addresses
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14413 Trailwind Rd, Poway, CA 92064 (858) 549-7321 (858) 513-0436
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7625 Andasol St, San Diego, CA 92126 (858) 549-7321
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14413 Trailwind Rd, Poway, CA 92064
Publications
Us Patents
Simplified Quality Indicator Bit Test Procedures
View pageUS Patent:
20020064133, May 30, 2002
Filed:
Mar 30, 2001
Appl. No.:
09/822947
Inventors:
Tao Chen - San Diego CA, US
Vince Butsumyo - San Diego CA, US
Levent Aydin - San Diego CA, US
Vince Butsumyo - San Diego CA, US
Levent Aydin - San Diego CA, US
International Classification:
G08C015/00
H04J001/16
H04B007/216
H04J001/16
H04B007/216
US Classification:
370/252000, 370/335000
Abstract:
In a code division multiple access communication system, a method and apparatus provide for an efficient testing of operating behavior of a quality indicator bit. The method and the accompanying apparatus include configuring a receiver to expect to receive a communication channel at a full data rate, and transmitting a signal from a transmitter to the receiver. The signal is carrying the communication channel at a data rate other than said full data rate, and at a power level for receiving at the full data rate. Consequently, the receiver fails to receive the communication channel at the full data rate. A received signal to noise ratio of the received signal at the receiver is determined. A value of the quality indicator bit is determined based on the determined signal to noise ratio. The determined value of the quality indicator bit is communicated to the transmitter.