Resumes
Resumes
Ronald Kovach Phones & Addresses
-
339 Grandview Way, Charleroi, PA 15022 (724) 565-4746 (724) 684-4960
-
948 Athalia Ave, Monessen, PA 15062 (724) 684-4464
-
952 Athalia Ave, Monessen, PA 15062 (724) 684-4960
-
Baltimore, MD
-
Belle Vernon, PA
-
339 Grandview Way, Charleroi, PA 15022 (724) 565-4746
Work
Position:
Professional/Technical
Education
Degree:
High school graduate or higher
Emails
Publications
Us Patents
Dual-Wavelength Spectrophotometry System
View pageUS Patent:
47952563, Jan 3, 1989
Filed:
Mar 9, 1987
Appl. No.:
7/023567
Inventors:
Andrew W. Krause - Baltimore MD
Charles G. Marianik - Plainsboro NJ
Ronald J. Kovach - Langhorne PA
Charles G. Marianik - Plainsboro NJ
Ronald J. Kovach - Langhorne PA
Assignee:
Photon Technology International, Inc. - Princeton NJ
International Classification:
G01J 308
G01J 3427
G01N 2164
G01J 3427
G01N 2164
US Classification:
356320
Abstract:
A dual wavelength spectrophotometer produces a relatively small, high power, high duty cycle light spot from a single relatively low power multi-chromatic light source. A Xenon arc lamp light source is focused by an ellipsoidal mirror onto a rotating partially reflective optical chopper. The chopper comprises a wheel having mirrored segments alternately separated by transparent segments. Light reflected by the mirrored segments passes through a first monochromator which produces a first monochromatic light beam. Light transmitted through the transparent segments passes through a second monochromator and emerges as a second monochromatic light beam having a wavelength different from the wavelength of said first monochromatic light beam. The first and second monochromatic light beams are recombined into a single dual wavelength light beam that is reflected through a sample to be analyzed. Reflective front surfaces are employed throughout the system in order to minimize power loss.