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Roger Bentley Proksch

from Santa Barbara, CA
Age ~60
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Also known as:
Roger B Proksch, Roger Bentl Proksch, Roger P Proksch, Roger Prosch, Proksch Roger
Phone and address:
2020 Foothill Rd, Santa Barbara, CA 93105
(805) 564-3483
Related to:
Irene R Proksch, 59Andrea E Proksch, 60Irene Revenko, 59Virginia Remington, 88Kristine M King, 55Jeffery A Ward, 61Helen J Remington, 88Raymond Victor King, 63Norbert J ProkschAndrew J Remington, 87
Connected to:
Julie C Proksch, 56Michelle A Proksch, 65Sandy Proksch, 80Anastasia Prokudina, 38Linda E Prokuski, 69Joseph J Prol, 58Rick M Prol, 67Diana J Prola, 81Rachelle Prola, 54Suzanne M Proleika, 56

Roger Proksch Phones & Addresses

  • 2020 Foothill Rd, Santa Barbara, CA 93105 (805) 564-3483
  • 960 W Mountain Dr, Santa Barbara, CA 93103 (805) 451-2833
  • 206 San Clemente St, Santa Barbara, CA 93109 (805) 564-3483
  • Goleta, CA
  • Minneapolis, MN

Work

Company: Asylum research, an oxford instruments company Dec 2016 to Apr 2019 Position: Chief executive officer

Education

Degree: Doctorates, Doctor of Philosophy School / High School: University of Minnesota 1987 to 1993 Specialities: Physics, Philosophy

Skills

Nanotechnology • Materials Science • Characterization • Physics • Thin Films • Afm • Spectroscopy • Nanomaterials • Scanning Probe Microscopy • Microscopy • Optics • Metrology • Sensors • Science • Scanning Electron Microscopy • Materials • Surface Chemistry • Nanoparticles • Semiconductors • Matlab • R&D • Bees • Marketing Strategy • Photovoltaics • Electronics • Research • Chemistry • Long Distance Running • Experimentation • Product Development • Research and Development • Humanitarian • Sailing

Industries

Nanotechnology

Resumes

Resumes

Roger Proksch Photo 1

Chief Technology Officer

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Location:
6310 Hollister Ave, Santa Barbara, CA 93117
Industry:
Nanotechnology
Work:
Asylum Research, An Oxford Instruments Company Dec 2016 - Apr 2019
Chief Executive Officer
Asylum Research and Oxford Instruments Dec 2016 - Apr 2019
Chief Technology Officer
Asylum Research, An Oxford Instruments Company 2013 - Dec 2016
President
Asylum Research, An Oxford Instruments Company 1999 - 2012
President
Education:
University of Minnesota 1987 - 1993
Doctorates, Doctor of Philosophy, Physics, Philosophy Luther College 1982 - 1986
Bachelors, Bachelor of Arts, Physics University of Minnesota - Twin Cities
Skills:
Nanotechnology
Materials Science
Characterization
Physics
Thin Films
Afm
Spectroscopy
Nanomaterials
Scanning Probe Microscopy
Microscopy
Optics
Metrology
Sensors
Science
Scanning Electron Microscopy
Materials
Surface Chemistry
Nanoparticles
Semiconductors
Matlab
R&D
Bees
Marketing Strategy
Photovoltaics
Electronics
Research
Chemistry
Long Distance Running
Experimentation
Product Development
Research and Development
Humanitarian
Sailing

Publications

Us Patents

Diffractive Optical Position Detector

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US Patent:
6884981, Apr 26, 2005
Filed:
Aug 23, 2002
Appl. No.:
10/226625
Inventors:
Roger Proksch - Santa Barbara CA, US
Jason Cleveland - Ventura CA, US
Dan Bocek - Goleta CA, US
Assignee:
Asylum Research Corp. - Santa Barbara CA
International Classification:
G02B007/04
US Classification:
2502013, 250306
Abstract:
An apparatus and method for measuring optically the position or angle of a variety of objects or arrays of objects, including cantilevers in scanning probe microscopy, micromechanical biological and chemical sensors and the sample or a probe in surface profilometry. The invention involves the use of one or more diffractive optical elements, including diffraction gratings and holograms, combined with conventional optical elements, to form a plurality of light beams, each with a selectable shape and intensity, from a single light source, reflect the beams off mechanical objects and process the reflected beams, all to the end of measuring the position of such objects with a high degree of precision. The invention may also be used to effect mechanical changes in such objects. Devices with these improvements have numerous applications, including molecular force measurements, atomic force microscopy and manipulation technology, lithographic manufacturing, nanometer scale surface profiling and other aspects of nanotechnology.

Linear Variable Differential Transformers For High Precision Position Measurements

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US Patent:
7038443, May 2, 2006
Filed:
Oct 10, 2003
Appl. No.:
10/683592
Inventors:
Roger Proksch - Santa Barbara CA, US
Jason Cleveland - Ventura CA, US
Dan Bocek - Goleta CA, US
Assignee:
Asylum Research Corporation - Santa Barbara CA
International Classification:
G01B 7/14
US Classification:
32420718, 32420724, 34087036
Abstract:
A linear variable transformer (LVDT) for use in a transducer. The LVDT has a non-ferromagnetic core which may eliminate Barkhausen noise and thereby improve the sensitivity of the resulting measurements. In one aspect, this system may be used in an atomic force microscope.

Noncontact Sensitivity And Compliance Calibration Method For Cantilever-Based Insturments

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US Patent:
7066005, Jun 27, 2006
Filed:
Feb 28, 2002
Appl. No.:
10/087196
Inventors:
Roger Proksch - Santa Barbara CA, US
Assignee:
Asylum Research Corporation - Santa Barbara CA
International Classification:
G01B 21/30
G01B 21/00
G01B 11/00
US Classification:
73 179, 73 189
Abstract:
A method for determining physical properties of micromachined cantilevers used in cantilever-based instruments, including atomic force microscopes, molecular force probe instruments and chemical or biological sensing probes. The properties that may be so determined include optical lever sensitivity, cantilever spring constant and cantilever-sample separation. Cantilevers characterized with the method may be used to determine fluid flow rates. The method is based on measurements of cantilever deflection resulting from drag force as the cantilever is moved through fluid. Unlike other methods for determining such physical properties of cantilevers, the method described does not depend on cantilever contact with a well-defined rigid surface. Consequently, the method may be employed in situations where such contact is undesirable or inconvenient. The method has numerous applications, including molecular force measurements, atomic force microscopy and manipulation technology, chemical or biological sensing, [lithographic manufacturing, nanometer scale surface profiling] and other aspects of nanotechnology.

Diffractive Optical Position Detector In An Atomic Force Microscope Having A Moveable Cantilever

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US Patent:
7084384, Aug 1, 2006
Filed:
Mar 28, 2005
Appl. No.:
11/093187
Inventors:
Roger Proksch - Santa Barbara CA, US
Jason Cleveland - Ventura CA, US
Dan Bocek - Goleta CA, US
Assignee:
Asylum Research Corporation - Santa Barbara CA
International Classification:
G02B 7/04
US Classification:
2502013, 250306
Abstract:
An apparatus and method for measuring optically the position or angle of a variety of objects or arrays of objects, including cantilevers in scanning probe microscopy, micromechanical biological and chemical sensors and the sample or a probe in surface profilometry. The invention involves the use of one or more diffractive optical elements, including diffraction gratings and holograms, combined with conventional optical elements, to form a plurality of light beams, each with a selectable shape and intensity, from a single light source, reflect the beams off mechanical objects and process the reflected beams, all to the end of measuring the position of such objects with a high degree of precision. The invention may also be used to effect mechanical changes in such objects. Devices with these improvements have numerous applications, including molecular force measurements, atomic force microscopy and manipulation technology, lithographic manufacturing, nanometer scale surface profiling and other aspects of nanotechnology.

Position Sensing Assembly With Sychronizing Capability

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US Patent:
7233140, Jun 19, 2007
Filed:
Apr 11, 2006
Appl. No.:
11/402482
Inventors:
Roger Proksch - Santa Barbara CA, US
Jason Cleveland - Ventura CA, US
Dan Bocek - Goleta CA, US
Assignee:
Asylum Research Corporation - Santa Barbara CA
International Classification:
G01B 7/14
US Classification:
32420718, 32420724, 34087036
Abstract:
A linear variable transformer, or LVDT, for use with the transducer, which has a non-ferromagnetic core that can eliminate Barkhausen noise. By eliminating the Barkhausen noise, the sensitivity of the resulting measurements can be improved. The LVDT is formed of multiple coil assemblies which are moved relative to one another, and by using a non-ferromagnetic material, are capable of obtaining 1 μ resolution or better. Circuitry for obtaining a synchronous output is described, allowing a differential amplifier to synchronize one signal to another.

Fully Digital Controller For Cantilever-Based Instruments

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US Patent:
7234342, Jun 26, 2007
Filed:
Dec 18, 2003
Appl. No.:
10/740940
Inventors:
Roger Proksch - Santa Barbara CA, US
Jason Cleveland - Ventura CA, US
Dan Bocek - Goleta CA, US
Todd Day - Goleta CA, US
Mario Viani - Santa Barbara CA, US
Clint Callahan - Santa Barbara CA, US
Assignee:
Asylum Research Corporation - Santa Barbara CA
International Classification:
G12B 21/20
US Classification:
73105, 250306, 702 94
Abstract:
A controller for cantilever-based instruments, including atomic force microscopes, molecular force probe instruments, high-resolution profilometers and chemical or biological sensing probes. The controller samples the output of the photo-detector commonly used to detect cantilever deflection in these instruments with a very fast analog/digital converter (ADC). The resulting digitized representation of the output signal is then processed with field programmable gate arrays and digital signal processors without making use of analog electronics. Analog signal processing is inherently noisy while digital calculations are inherently “perfect” in that they do not add any random noise to the measured signal. Processing by field programmable gate arrays and digital signal processors maximizes the flexibility of the controller because it can be varied through programming means, without modification of the controller hardware.

Linear Variable Differential Transformers For High Precision Position Measurements

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US Patent:
7271582, Sep 18, 2007
Filed:
Apr 10, 2006
Appl. No.:
11/401781
Inventors:
Roger Proksch - Santa Barbara CA, US
Jason Cleveland - Ventura CA, US
Dan Bocek - Goleta CA, US
Assignee:
Asylum Research Corporation - Santa Barbara CA
International Classification:
G01B 7/14
US Classification:
32420718, 32420724, 34087036
Abstract:
A linear variable transformer (LVDT) for use in a transducer. The LVDT has a non-ferromagnetic core which may eliminate Barkhausen noise and thereby improve the sensitivity of the resulting measurements. In one aspect, this system may be used in an atomic force microscope.

Linear Force Detecting Element Formed Without Ferromagnetic Materials Which Produces A Resolution In A Range Of Microns Or Less

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US Patent:
7372254, May 13, 2008
Filed:
Apr 12, 2006
Appl. No.:
11/404165
Inventors:
Roger Proksch - Santa Barbara CA, US
Jason Cleveland - Ventura CA, US
Dan Bocek - Goleta CA, US
Assignee:
Asylum Research Corporation - Santa Barbara CA
International Classification:
G01B 7/14
US Classification:
32420718, 32420724, 34087036
Abstract:
A force detecting element is used to move a moving coil that is formed without ferromagnetic materials and is driven using a stationary coil that is formed without ferromagnetic materials, thereby producing an output signal which is more linear than the previous techniques. The output signal produces an output indicative of a resolution in the range of microns or less.
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Roger Bentley Proksch from Santa Barbara, CA, age ~60 Get Report