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Pavel A Fomitchov

from New York, NY
Age ~58
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Also known as:
Pavel V
Related to:
Irina L Derkatch, 58Masha Fomitchov, 25
Connected to:
Siri Fomsgaard, 44Thomas B Fomukong, 57Juliet N Fomunung, 40Robin Fomusa, 33Florence Fomuso, 62Brian R Fon, 57Charles Fon, 34Christine L Fon, 72Emmanuel T Fon, 46Jose V Fon, 54

Pavel Fomitchov Phones & Addresses

  • New York, NY
  • Oak Park, IL
  • Clifton Park, NY
  • Schenectady, NY
  • 5 Peter Cooper Rd APT 5F, New York, NY 10010

Work

Company: Ge healthcare Jan 2011 Address: Piscataway, NJ Position: Principal engineer

Education

Degree: PhD School / High School: Leningrad Institute of Fine Mechanics and Optics 1990 to 1994 Specialities: physics

Skills

R&D • Medical Devices • Microscopy • Digital Imaging • Product Development • Lifesciences • Fluorescence • Systems Engineering • Six Sigma • Sensors • Life Sciences • Characterization • Biomedical Engineering • Optics • Cross Functional Team Leadership • Project Management • Optical Engineering • Confocal Microscopy • Research • Fda • Signal Processing • Image Processing • Design Control • Cell • Agile Methodologies • Imaging Science • Agile Project Management • High Content Screening • Intellectual Property • Research and Development • User Experience Design • Physical Optics

Languages

English • Russian

Ranks

Certificate: Project Management Professional (Pmp) Certification

Interests

Leadership • Innovation • Project Management • Business Development • Marketing • Image Based Diagnosticspersonal • Image Based Diagnostics • Literature • Personal • Music • Image Based Diagnostics Personal • Professional • Travel

Industries

Computer Software

Resumes

Resumes

Pavel Fomitchov Photo 1

General Manager

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Location:
New York, NY
Industry:
Computer Software
Work:
GE Healthcare - Piscataway, NJ since Jan 2011
Principal Engineer
GE Healthcare - GE Healthcare, Life Sciences, Piscataway, NJ Oct 2004 - Jan 2011
Staff Engineer
GE Global Research - GE Global Research, Niskayuna, New York Jul 2002 - Oct 2004
Optical Scientist
Northwestern University - Evanston, IL 2000 - 2002
Research Assistant Professor
Northwestern University - Evanston, IL 1994 - 2000
Research Associate
Education:
Leningrad Institute of Fine Mechanics and Optics 1990 - 1994
PhD, physics
Skills:
R&D
Medical Devices
Microscopy
Digital Imaging
Product Development
Lifesciences
Fluorescence
Systems Engineering
Six Sigma
Sensors
Life Sciences
Characterization
Biomedical Engineering
Optics
Cross Functional Team Leadership
Project Management
Optical Engineering
Confocal Microscopy
Research
Fda
Signal Processing
Image Processing
Design Control
Cell
Agile Methodologies
Imaging Science
Agile Project Management
High Content Screening
Intellectual Property
Research and Development
User Experience Design
Physical Optics
Interests:
Leadership
Innovation
Project Management
Business Development
Marketing
Image Based Diagnosticspersonal
Image Based Diagnostics
Literature
Personal
Music
Image Based Diagnostics Personal
Professional
Travel
Languages:
English
Russian
Certifications:
Project Management Professional (Pmp) Certification
Six Sigma Black Belt (Design For Six Sigma)
Six Sigma Green Belt
Project Management Institute
Ge Healthcare
Ge Global Research

Publications

Us Patents

System And Method For Utilizing An Autofocus Feature In An Automated Microscope

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US Patent:
7297910, Nov 20, 2007
Filed:
Dec 30, 2005
Appl. No.:
11/320676
Inventors:
Pavel A. Fomitchov - New York NY, US
Assignee:
General Electric Company - Schenectady NY
International Classification:
G02B 7/04
G02B 27/40
G03B 13/00
US Classification:
2502012, 2502014, 348345
Abstract:
The invention relates to a method for adjusting focus in an automated microscope. The method may comprise the steps of: providing an optical detector for image acquisition, wherein the optical detector comprises an array of sensor pixels; designating a region of interest in the array of sensor pixels to emulate a confocal aperture; directing a light beam to illuminate an object according to a predefined pattern, thereby forming an image of the illuminated pattern at the optical detector, wherein the image of the illuminated pattern substantially overlaps the designated region of interest; detecting a light intensity from sensor pixels located within the designated region of interest; and adjusting a relative focal position of an objective lens based on the detected light intensity.

Method And Apparatus For Fluorescent Confocal Microscopy

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US Patent:
7335898, Feb 26, 2008
Filed:
Jul 19, 2005
Appl. No.:
11/184444
Inventors:
Paul Donders - Stoney Creek, CA
Carlos Zarate - Hamilton, CA
Pavel A. Fomitchov - New York NY, US
Assignee:
GE Healthcare Niagara Inc. - Ontario
International Classification:
G01N 21/64
US Classification:
2504581, 2504591, 2504611
Abstract:
A new and improved confocal fluorescence microscope is presented. The new microscope has significant advantages relative to existing implementations of microscope confocal imagers. In common with previous confocal imagers the instant invention has the advantages relative to conventional wide-field and confocal fluorescence imagers, however it addresses the drawbacks of confocal technology in terms of cost and complexity, and provides significant savings in both due to the simplicity of the components and the elimination of the need of, in particular, spatial filters such as pinholes or slits.

Laser Plasma Spectroscopy Apparatus And Method For In Situ Depth Profiling

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US Patent:
7440097, Oct 21, 2008
Filed:
Jun 27, 2006
Appl. No.:
11/426708
Inventors:
Pamela King Benicewicz - Loudonville NY, US
Pavel Alexeyevich Fomitchov - New York NY, US
Elena Rozier - Schenectady NY, US
John Ruediger Mader Viertl - Niskayuna NY, US
Tymm Bradner Schumaker - Saratoga Springs NY, US
Assignee:
General Electric Company - Niskayuna NY
International Classification:
G01J 3/443
G01J 3/30
G01N 21/63
G01B 11/22
G01B 11/06
US Classification:
356316, 356318, 356626
Abstract:
An in-situ laser plasma spectroscopy (LPS) system for automated near real-time elemental depth profiling of a target including: an optical source configured to generate an optical beam, wherein the optical beam is pulsed; an optical probe system configured to deliver the optical beam from the optical source to a surface of a target to generate an ablation plasma; a time resolved spectral detection system configured to generate time resolved spectral data from emission signals from the ablation plasma; and a data acquisition and processing system configured to acquire the time resolved spectral data to determine, in combination with predetermined calibration data, an absolute elemental concentration as a function of depth in near real-time.

System And Method For Utilizing An Autofocus Feature In An Automated Microscope

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US Patent:
7473877, Jan 6, 2009
Filed:
Oct 31, 2007
Appl. No.:
11/930206
Inventors:
Pavel A. Fomitchov - New York NY, US
Assignee:
General Electric Company - Schenectady NY
International Classification:
G02B 7/04
US Classification:
2502012, 2502013
Abstract:
The invention relates to a method for adjusting focus in an automated microscope. The method may comprise the steps of: providing an optical detector for image acquisition, wherein the optical detector comprises an array of sensor pixels; designating a region of interest in the array of sensor pixels to emulate a confocal aperture; directing a light beam to illuminate an object according to a predefined pattern, thereby forming an image of the illuminated pattern at the optical detector, wherein the image of the illuminated pattern substantially overlaps the designated region of interest; detecting a light intensity from sensor pixels located within the designated region of interest; and adjusting a relative focal position of an objective lens based on the detected light intensity.

System And Method For Multimode Imaging

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US Patent:
7567346, Jul 28, 2009
Filed:
Mar 1, 2006
Appl. No.:
11/363938
Inventors:
Pavel A. Fomitchov - New York NY, US
Eugene Barash - Niskayuna NY, US
Ahmad Yetka - Somerset NJ, US
Joseph Masino, III - Howell NJ, US
Assignee:
General Electric Company - Schenectady NY
International Classification:
G01N 21/25
US Classification:
356416, 382282, 382284, 359385, 359368
Abstract:
A system and method for multimode imaging of at least one sample is disclosed. The system includes at least one light source; an optical system selected responsive to a mode of operation of the imaging system; and a detector capable of selective reading of pixels. The at least one sample is moved elative to the optical system using a sample movement technique selected from the group consisting of step sample moving and continuous sample moving. The method includes the steps of (1) selecting a mode of operation for the imaging system; (2) transmitting light from at least one light source through an optical system selected in response to the mode of operation for the imaging system; (3) moving the at least one sample relative to the optical system using a sample movement technique selected from the group consisting of step sample moving and continuous sample moving; and (4) selectively reading pixels with a detector.

System And Method To Decrease Probe Size For Improved Laser Ultrasound Detection

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US Patent:
7576848, Aug 18, 2009
Filed:
Dec 21, 2004
Appl. No.:
11/018994
Inventors:
Marc Dubois - Clifton Park NY, US
Pavel Fomitchov - New York NY, US
Assignee:
Lockheed Martin Corporation - Bethesda MD
International Classification:
G01N 21/00
US Classification:
3562371, 356614
Abstract:
The present invention provides a compact optical probe assembly that measures ultrasound in materials. The probe uses angle-terminated optical fiber to direct illumination laser light at the surface of a remote target. Ultrasonic displacements at the surface scatter the illumination laser light. Angle-terminated optical fibers collect phase modulated light and direct the phase modulated light to an optical processor to produce a signal representative of the ultrasonic surface displacements. The probe may also incorporate angle-terminated optical fibers to direct generation laser light to the surface of a remote target to generate ultrasonic surface displacements. Optional shared beam forming element(s) may optically act on the illumination laser and collected phase modulated light.

Scanhead Assembly

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US Patent:
D603965, Nov 10, 2009
Filed:
Feb 26, 2007
Appl. No.:
29/277414
Inventors:
Kaushal Verma - Franklin Park NJ, US
Joseph Masino - Howell NJ, US
Pavel A. Fomitchov - New York NY, US
Liqin Wang - Belle Mead NJ, US
Assignee:
GE Healthcare Bio-Sciences Corp. - Piscataway NJ
International Classification:
2401
US Classification:
D24158

System And Method For Fiber Optic Bundle-Based Illumination For Imaging System

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US Patent:
7953308, May 31, 2011
Filed:
Dec 30, 2005
Appl. No.:
11/320675
Inventors:
Pavel A. Fomitchov - New York NY, US
Assignee:
General Electric Company - Schenectady NY
International Classification:
G02B 6/06
US Classification:
385116, 385118
Abstract:
A system and method for fiber optic bundle-based illumination for an imaging system is disclosed. According to one embodiment of the present invention, the system includes a fiber optic bundle that comprising a plurality of optical fibers. Each optical fiber receives light from a light source. The system also includes a beam forming element that selects a mode of operation for the imaging system. The system further includes a beam deflecting device that deflects the light on a sample. According to one embodiment of the present invention, the method includes the steps of (1) selecting a mode of operation for the imaging system; (2) transmitting light from at least one light source through a fiber optic bundle, the fiber optic bundle comprising a plurality of optical fibers; (3) providing a beam forming element based on the selected mode of operation; and (4) deflecting the focused light on a sample.
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Pavel A Fomitchov from New York, NY, age ~58 Get Report