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Naweed Anjum

from Murphy, TX
Age ~46

Naweed Anjum Phones & Addresses

  • 630 Forest Hill Dr, Plano, TX 75094
  • 5921 Wamego Ln, Plano, TX 75094
  • Murphy, TX
  • Greenville, TX
  • Wylie, TX
  • McKinney, TX
  • Richardson, TX
  • Edwardsville, IL

Resumes

Resumes

Naweed Anjum Photo 1

Section Manager At Texas Instruments

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Location:
Dallas/Fort Worth Area
Industry:
Semiconductors
Naweed Anjum Photo 2

Test And Product Engineering Branch Manager

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Location:
Dallas, TX
Industry:
Semiconductors
Work:
Texas Instruments since Nov 2008
Section Manager

Texas Instruments Aug 2006 - Oct 2008
Project Manager

Texas Instruments Aug 1999 - Sep 2007
Senior Failure Analysis Engineer

Texas Instruments - WTBU 1999 - 2007
Sr FA Engineer
Education:
Southern Illinois University, Edwardsville 1998 - 2000
M.S, Electrical and Electronic Engineering
Osmania University 1994 - 1998
BE, ECE
Skills:
Semiconductors
Failure Analysis
Product Development
Ic
Silicon
Project Management
Root Cause Analysis
Soc
Semiconductor Industry
Asic
Analog
Electronics
Naweed Anjum Photo 3

Section Manager At Texas Instruments

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Position:
Section Manager at Texas Instruments
Location:
Dallas/Fort Worth Area
Industry:
Electrical/Electronic Manufacturing
Work:
Texas Instruments since Nov 2008
Section Manager

Texas Instruments Aug 2007 - Nov 2008
Project Manager
Education:
Southern Illinois University, Edwardsville 1998 - 2002
Osmania University 1994 - 1998
BS(ECE), Electronics and Communication Engineering

Business Records

Name / Title
Company / Classification
Phones & Addresses
Naweed Anjum
Director
EAST END TRADING, INC
Whol Nondurable Goods
5616 Saint Thomas Dr, Plano, TX 75094
5921 Wamego Ln, Plano, TX 75094
Naweed Anjum
Director
AZAANS INC
Nonclassifiable Establishments
1108 Pleasanton Dr, Plano, TX 75094
5921 Wamego Ln, Plano, TX 75094

Publications

Us Patents

Method, Apparatus And System For Detecting Anomalies In Mixed Signal Devices

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US Patent:
20080219546, Sep 11, 2008
Filed:
Mar 8, 2007
Appl. No.:
11/683548
Inventors:
Dat T. Nguyen - Murphy TX, US
Thao To - Plano TX, US
David Maxwell - Wylie TX, US
Naweed Anjum - Plano TX, US
International Classification:
G06K 9/80
US Classification:
382149
Abstract:
An embodiment relates generally to a method of testing a mixed signal device. The method includes monitoring multiple parameters of the mixed signal device and scanning the mixed signal device with an optical source. The method also includes forming multiple windows, where each window is assigned to a respective parameter. The method further includes comparing an image from a respective image to a reference image to determine an existence of an anomaly.

Electronic Device Package With Board Level Reliability

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US Patent:
20200227328, Jul 16, 2020
Filed:
Dec 23, 2019
Appl. No.:
16/725738
Inventors:
- Dallas TX, US
Naweed Anjum - Murphy TX, US
International Classification:
H01L 21/66
G06F 30/367
G01R 31/28
Abstract:
In a described example, a method includes: providing a product package for a product die; building a product mimic die that mimics the product die and which is configured to make the product package functional for use in reliability testing; packaging the product mimic die in the product package to form a packaged product mimic die; reliability testing the packaged product mimic die; responsive to the reliability testing, revising the product package; and repeating the steps of reliability testing and revising the product package until the product package passes the reliability tests.
Naweed Anjum from Murphy, TX, age ~46 Get Report