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Malina A Kirn

from Burlington, VT
Age ~44
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Also known as:
Malina Aurelia Kirn, Malina S Kirn, Malina A Schindel, Aurelia Kirn Malina, Malin Kirn, Kirn Malin, Kirn Malina
Phone and address:
19 Kingsland Ter, Burlington, VT 05401
Related to:
Ji Sun Cloteaux, 49Daniel Madden, 49Cal Vestal, 29Elisabeth B Graci, 41Julie Walkup, 67Scott Bozarth, 41
Connected to:
Alexander C Kirn, 41Brittany A Kirn, 35Diana L Kirn, 61Douglas B Kirn, 49Elizabeth R Kirn, 111Fred J Kirn, 116Lynn J Kirn, 51Marda W Kirn, 74Ronald C Kirn, 66Ryan K Kirn, 55

Malina Kirn Phones & Addresses

  • 19 Kingsland Ter, Burlington, VT 05401
  • Frenchtown, MT
  • Reston, VA
  • Cambridge, MA
  • Arlington, VA
  • Bozeman, MT
  • Washington, DC
  • 1200 N Herndon St APT 707, Arlington, VA 22201

Work

Company: Palantir technologies Sep 2011 Position: Embedded analyst

Education

Degree: Doctor of Philosophy (PhD) School / High School: University of Maryland College Park 2005 to 2011 Specialities: Scientific Computing

Skills

Scientific Computing • Programming • Java • Python • Physics • Machine Learning • Data Analysis • System Administration • Agile Methodologies • Technical Project Leadership • Engineering Management • Public Lectures • Sql • Shell Scripting • Algorithms • Particle Physics • C++ • Git • Distributed Systems • Science • Experimentation • Research • Linux System Administration • Red Hat Linux • Particle Astrophysics • Balloon Science • University Teaching

Industries

Automotive

Resumes

Resumes

Malina Kirn Photo 1

Principal Technical Architect

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Location:
7 Lane Farm Dr, Bedford, MA 01730
Industry:
Automotive
Work:
Palantir Technologies since Sep 2011
Embedded Analyst
Compact Muon Solenoid (CMS) experiment May 2006 - Sep 2011
Research associate
University of Maryland, College Park Aug 2005 - Sep 2011
Research associate
ISSGC Jul 2009 - Jul 2009
Student
Fermilab May 2006 - Aug 2008
Research associate
Education:
University of Maryland College Park 2005 - 2011
Doctor of Philosophy (PhD), Scientific Computing Montana State University-Bozeman 2003 - 2005
MS, Physics Montana State University-Bozeman 1998 - 2003
BS, Physics, minors Math & Computer Science
Skills:
Scientific Computing
Programming
Java
Python
Physics
Machine Learning
Data Analysis
System Administration
Agile Methodologies
Technical Project Leadership
Engineering Management
Public Lectures
Sql
Shell Scripting
Algorithms
Particle Physics
C++
Git
Distributed Systems
Science
Experimentation
Research
Linux System Administration
Red Hat Linux
Particle Astrophysics
Balloon Science
University Teaching

Publications

Us Patents

Data Quality Monitors

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US Patent:
8601326, Dec 3, 2013
Filed:
Jul 5, 2013
Appl. No.:
13/935861
Inventors:
Malina Kirn - Arlington VA, US
Assignee:
Palantir Technologies, Inc. - Palo Alto CA
International Classification:
G06F 11/00
US Classification:
714 46, 714 26, 707687
Abstract:
Systems and methods are presented for data quality monitoring. Data quality monitors may be created and configured to identify objects with specified data quality issues and/or property values. Objects identified by a data quality monitor can be presented to users for confirmation and resolution. Properties used by the data quality monitor to match objects may also be displayed to users.

System And Method For Data Quality Monitors

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US Patent:
20210326313, Oct 21, 2021
Filed:
Apr 5, 2021
Appl. No.:
17/222308
Inventors:
- Denver CO, US
Malina Kirn - Arlington VA, US
International Classification:
G06F 16/215
G06F 16/23
G06F 16/2455
G06F 11/07
A61B 17/00
A61B 17/04
G06F 3/0482
G06F 3/0484
Abstract:
Systems and methods are presented for data quality monitoring. Data quality monitors may be created and configured to identify objects with specified data quality issues and/or property values. Objects identified by a data quality monitor can be presented to users for confirmation and resolution. Properties used by the data quality monitor to match objects may also be displayed to users.

System And Method For Data Quality Monitors

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US Patent:
20160342629, Nov 24, 2016
Filed:
May 18, 2016
Appl. No.:
15/158410
Inventors:
- Palo Alto CA, US
Malina Kirn - Arlington VA, US
International Classification:
G06F 17/30
G06F 3/0482
G06F 3/0484
Abstract:
Systems and methods are presented for data quality monitoring. Data quality monitors may be created and configured to identify objects with specified data quality issues and/or property values. Objects identified by a data quality monitor can be presented to users for confirmation and resolution. Properties used by the data quality monitor to match objects may also be displayed to users.

Data Quality Monitors

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US Patent:
20150012509, Jan 8, 2015
Filed:
Dec 2, 2013
Appl. No.:
14/094418
Inventors:
- Palo Alto CA, US
Malina Kirn - Arlington VA, US
Assignee:
Palantir Technologies, Inc. - Palo Alto CA
International Classification:
G06F 17/30
US Classification:
707700
Abstract:
Systems and methods are presented for data quality monitoring. Data quality monitors may be created and configured to identify objects with specified data quality issues and/or property values. Objects identified by a data quality monitor can be presented to users for confirmation and resolution. Properties used by the data quality monitor to match objects may also be displayed to users.
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Malina A Kirn from Burlington, VT, age ~44 Get Report