Inventors:
Felix Stukalin - Framingham MA
Kristopher F. Pruyn - Bedford MA
Assignee:
Digital Equipment Corporation - Maynard MA
International Classification:
H01R 13533
Abstract:
A test fixture for facilitating connection between a pin grid array, such as those found on multi-lead electronic components, and the test leads of a diagnostic device, useful for testing such components after they are mounted on printed circuit boards. A base element is formed of transparent plastic material and carries an array of connectors, the number and arrangement of which depend upon the component to be tested. Each connector includes a test lead connector, adapted for attachment to a test lead, and a pin engagement member, adapted for making and retaining physical contact with a component pin. The pin engagement member is carried resiliently in the connector body, able to move longitudinally therein. A resilient seal means extends around the outer periphery of the underside of the base member, defining a well in the space below the base member. The seal means may include multiple resilient seal layers, separated by stiffeners.