Search

Kenneth W Deboe

from Port Saint Lucie, FL
Age ~72
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Also known as:
Ken V Deboe, Kenneth W Debue, Kenneth Dubois, Lydia Deboe, Kenneth De, Ken W De
Phone and address:
922 Dubois Ave, Fort Pierce, FL 34953
(772) 336-2895
Related to:
Todd A UtikalGladys DeboeLydia Deboe
Connected to:
Alicia Deboe, 35April C Deboe, 60Beverly A Deboe, 75Jack L Deboe, 40Nicole R Deboe, 48Sarah M Deboe, 41Joel D Deboef, 41Arden B Deboer, 66Autumn L Deboer, 37Barry G Deboer, 81

Kenneth Deboe Phones & Addresses

  • 922 Dubois Ave, Port Saint Lucie, FL 34953 (772) 336-2895
  • Fort Pierce, FL
  • Santa Clara, CA
  • Stuart, FL
  • Port St Lucie, FL

Work

Position: Sales/Service

Emails

t***[email protected]

Business Records

Name / Title
Company / Classification
Phones & Addresses
Kenneth Deboe
Managing
Deboe Studios LLC
Photography
3485 Shafer Dr, Santa Clara, CA 95051

Publications

Us Patents

Apparatus For Testing Electronic Devices

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US Patent:
7762822, Jul 27, 2010
Filed:
Apr 27, 2006
Appl. No.:
11/413323
Inventors:
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
H01R 13/44
US Classification:
439131
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Electronics Tester With A Signal Distribution Board And A Wafer Chuck Having Different Coefficients Of Thermal Expansion

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US Patent:
7902846, Mar 8, 2011
Filed:
Jan 7, 2010
Appl. No.:
12/684051
Inventors:
Steven C. Steps - Saratoga CA, US
Scott E. Lindsey - Brentwood CA, US
Kenneth W. Deboe - Santa Clara CA, US
Alberto Calderon - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
G01R 31/00
US Classification:
32475016, 32476205
Abstract:
The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.

Apparatus For Testing Electronic Devices

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US Patent:
8118618, Feb 21, 2012
Filed:
May 3, 2010
Appl. No.:
12/772932
Inventors:
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
H01R 24/00
US Classification:
439676
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Electronics Tester With A Signal Distribution Board And A Wafer Chuck Having Different Coefficients Of Thermal Expansion

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US Patent:
8198909, Jun 12, 2012
Filed:
Feb 8, 2011
Appl. No.:
13/022803
Inventors:
Steven C. Steps - Saratoga CA, US
Scott E. Lindsey - Brentwood CA, US
Kenneth W. Deboe - Santa Clara CA, US
Alberto Calderon - San Jose CA, US
Assignee:
AEHR Test Systems - Fremont CA
International Classification:
G01R 31/40
US Classification:
32476401, 32475605, 32476202, 324537
Abstract:
The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.

Apparatus For Testing Electronic Devices

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US Patent:
8388357, Mar 5, 2013
Filed:
Jan 18, 2012
Appl. No.:
13/353269
Inventors:
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
H01R 12/00
US Classification:
439 70
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Apparatus For Testing Electronic Devices

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US Patent:
8506335, Aug 13, 2013
Filed:
Jan 30, 2013
Appl. No.:
13/754765
Inventors:
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
AEHA Test Systems - Fremont CA
International Classification:
H01R 4/50
US Classification:
439770
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Apparatus For Testing Electronic Devices

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US Patent:
8628336, Jan 14, 2014
Filed:
Jul 11, 2013
Appl. No.:
13/939364
Inventors:
Kenneth W. Deboe - Santa Clara CA, US
Frank O. Uher - Los Altos CA, US
Jovan Jovanovic - Santa Clara CA, US
Scott E. Lindsey - Brentwood CA, US
Thomas T. Maenner - San Ramon CA, US
Patrick M. Shepherd - San Jose CA, US
Jeffrey L. Tyson - Mountain View CA, US
Mark C. Carbone - Cupertino CA, US
Paul W. Burke - Hayward CA, US
Doan D. Cao - San Jose CA, US
James F. Tomic - Oakland CA, US
Long V. Vu - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
H01R 12/00
US Classification:
439 70
Abstract:
An apparatus is described for burn-in and/or functional testing of microelectronic circuits of unsingulated wafers. A large number of power, ground, and signal connections can be made to a large number of contacts on a wafer. The apparatus has a cartridge that allows for fanning-in of electric paths. A distribution board has a plurality of interfaces that are strategically positioned to provide a dense configuration. The interfaces are connected through flexible attachments to an array of first connector modules. Each one of the first connector modules can be independently connected to a respective one of a plurality of second connector modules, thereby reducing stresses on a frame of the apparatus. Further features include for example a piston that allows for tight control of forces exerted by terminals onto contacts of a wafer.

Electronics Tester With A Signal Distribution Board And A Wafer Chuck Having Different Coefficients Of Thermal Expansion

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US Patent:
20090015282, Jan 15, 2009
Filed:
Apr 4, 2008
Appl. No.:
12/062988
Inventors:
Steven C. Steps - Saratoga CA, US
Scott E. Lindsey - Brentwood CA, US
Kenneth W. Deboe - Santa Clara CA, US
Alberto Calderon - San Jose CA, US
Assignee:
Aehr Test Systems - Fremont CA
International Classification:
G01R 31/3181
US Classification:
324760
Abstract:
The invention relates to a tester apparatus of the kind including a portable supporting structure for removably holding and testing a substrate carrying a microelectronic circuit. An interface on the stationary structure is connected to the first interface when the portable structure is held by the stationary structure and is disconnected from the first interface when the portable supporting structure is removed from the stationary structure. An electrical tester is connected through the interfaces so that signals may be transmitted between the electrical tester and the microelectronic circuit to test the microelectronic circuit.
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Kenneth W Deboe from Port Saint Lucie, FL, age ~72 Get Report