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Henry A Patland

from Napa, CA
Age ~58
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Also known as:
Henry Te Patland, Henry T Patland, Henry P Patland, Henry Portland, Atlund P Henry, Henry Null, Henry D
Related to:
Lilia MallerHenry Patland TrsteeVera Bril, 77Bell TorseMichael Patland, 31Boris S Netis, 59Solomon I Netis, 85Olga Netis, 57Jorge M Bell, 69
Connected to:
Jaime C Patlevic, 45Robert E Patlin, 78Aparna Patlola, 52Santhosh K Patlola, 47Sreedhar Patlola, 49Akhila R Patlolla, 47Pramod R Patlolla, 46Vishnu V Patlolla, 50Leigh G Patmagrian, 66Tracy L Patmalnee, 50

Henry Patland Phones & Addresses

  • Napa, CA
  • Miami Beach, FL
  • Las Vegas, NV
  • Santa Clara, CA
  • 610 Alpine Dr, South Lake Tahoe, CA 96150
  • 1807 Venice Dr, South Lake Tahoe, CA 96150
  • S Lake Tahoe, CA
  • Los Gatos, CA
  • Emeryville, CA
  • El Dorado, CA

Work

Company: Patland estate vineyards Sep 2007 Position: Proprietor

Education

Degree: BS School / High School: U.C. Santa Cruz Sep 1984 to May 1988 Specialities: Computer Engineering

Skills

Testing • Semiconductors • Electronics • Manufacturing • Cross Functional Team Leadership • Product Marketing • Product Development • Engineering Management • Product Management • Failure Analysis • Test Equipment • Storage • R&D • Start Ups • Engineering • Sensors • Embedded Systems • Six Sigma • Integration • Technology Leadership • Automation • Process Engineering • R

Languages

Russian

Interests

Making Amazing Wines

Industries

Computer Hardware

Resumes

Resumes

Henry Patland Photo 1

Proprietor

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Location:
610 Alpine Dr south, El Dorado, CA
Industry:
Computer Hardware
Work:
Patland Estate Vineyards since Sep 2007
Proprietor
Integral Solutions Int'l since Dec 1995
President & CEO
Akashic Memories 1994 - 1994
Sr. Software Engineer
Guzik Technical 1988 - 1994
Test Engineer
Education:
U.C. Santa Cruz Sep 1984 - May 1988
BS, Computer Engineering
Skills:
Testing
Semiconductors
Electronics
Manufacturing
Cross Functional Team Leadership
Product Marketing
Product Development
Engineering Management
Product Management
Failure Analysis
Test Equipment
Storage
R&D
Start Ups
Engineering
Sensors
Embedded Systems
Six Sigma
Integration
Technology Leadership
Automation
Process Engineering
R
Interests:
Making Amazing Wines
Languages:
Russian

Business Records

Name / Title
Company / Classification
Phones & Addresses
Henry Patland
President
Infinitum Solutions Inc
Custom Computer Programming Services
2192 Bering Dr, San Jose, CA 95131
Henry Patland
Director, President
Isied Inc
3000 Olcott St, Santa Clara, CA 95054
Henry Patland
Principal
Integral Solutions Intl
Nonclassifiable Establishments
2192 Bering Dr, San Jose, CA 95131
Henry Patland
Managing
Patland Estate Vineyards, LLC
Wine Production/Sales
110 Madera Ct, Los Gatos, CA 95032
Henry Patland
Olcott Investments LLC
Real Estate Ownership & Management · Investor
110 Madera Ct, Los Gatos, CA 95032
Henry Patland
President
PATLAND INDUSTRIES , INC
Mfg Misc Products
110 Madera Ct, Los Gatos, CA 95032
113 Leila Ct, Los Gatos, CA 95032
Henry Patland
Managing
Napa Valley Soda Canyon Resort LLC
Hospitality
110 Madera Ct, Los Gatos, CA 95032

Publications

Us Patents

Magnetoresistive Element Lifecycle Tester With Temperature Control

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US Patent:
7230420, Jun 12, 2007
Filed:
Jun 22, 2005
Appl. No.:
11/159635
Inventors:
Henry Patland - Los Gatos CA, US
Wade A. Ogle - San Jose CA, US
Assignee:
Infinitum Solutions, Inc. - Santa Clara CA
International Classification:
G01R 33/18
US Classification:
324209, 324210, 333201
Abstract:
A lifecycle analyzer includes a temperature control element for controlling the temperature of a plurality of magnetoresistive (MR) elements, which may be, e. g. , in bar, slider, head gimbal assembly, or head stack assembly form. The MR elements are in electrical contact with a stress probe element for applying a bias voltage or current stress. The MR elements and/or a magnetic field generator are moved to place one or more MR elements within the magnetic field of the magnetic field generator for testing. During testing, the MR elements are in electrical contact with a test probe element. The temperature of the MR elements may be controlled during both the stressing and testing.

In-Plane Magnetic Field Generation And Testing Of Magnetic Sensor

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US Patent:
7538546, May 26, 2009
Filed:
Nov 10, 2006
Appl. No.:
11/558779
Inventors:
Henry Patland - Los Gatos CA, US
Wade A. Ogle - San Jose CA, US
Assignee:
Infinitum Solutions, Inc. - Santa Clara CA
International Classification:
G01R 33/12
US Classification:
324210, 324262
Abstract:
A set of magnets, e. g. , electromagnets, are used to produce an in-plane magnetic field with respect to an article under test or manufacture. The set of electromagnets includes electromagnets that are positioned above and below the plane of symmetry respectively. The bottom electromagnets may be positioned below the surface of the chuck for example. The plane of the article and/or set of electromagnets are positioned so that the plane of symmetry approximately coincides with the article. The set of electromagnets may include individual electromagnets or C-core electromagnets, which may produce magnetic fields with complementary polarities near the field of symmetry both above and below the field of symmetry. Magnetic fields with the same polarity are positioned near each other on opposite sides of the plane of symmetry to produce the in-plane magnetic field. A second set of electromagnets may be used to provide field rotation if desired.

Closed Loop Magnet Control For Magnetic Recording Head Testing Apparatus

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US Patent:
7550967, Jun 23, 2009
Filed:
May 11, 2007
Appl. No.:
11/747880
Inventors:
Henry Patland - Los Gatos CA, US
Wade A. Ogle - San Jose CA, US
Oleg Shurygin - Cupertino CA, US
Ronald S. Selman - Santa Clara CA, US
Assignee:
Infinitum Solutions, Inc. - Santa Clara CA
International Classification:
G01R 33/12
US Classification:
324210
Abstract:
A magnetic recording head tester uses closed loop control to accurately control the magnetic field that is generated to test the magnetic recording head. The closed loop control compares the value of the sensed magnetic field to the desired value of the magnetic field and adjusts the magnetic field accordingly. A magnetic field sensor used in the tester may be located in a position that has a substantially different magnetic field magnitude than is experienced by the magnetic recording head. The value of the output signal from the magnetic field sensor is correlated to the magnitude of the magnetic field at the location of the magnetic recording head through calibration. The correlation can then be used to accurately produce the desired magnitude magnetic field at the location of the magnetic recording head.

Sub-Optical-Resolution Kerr Signal Detection For Perpendicular Write-Head Characterization

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US Patent:
8427929, Apr 23, 2013
Filed:
Sep 7, 2011
Appl. No.:
13/227414
Inventors:
Henry Patland - Los Gatos CA, US
Juergen Heidmann - Salinas CA, US
Wade A. Ogle - San Jose CA, US
Alexander M. Taratorin - Palo Alto CA, US
Assignee:
Infinitum Solutions, Inc. - Santa Clara CA
International Classification:
G11B 7/00
G01R 33/032
US Classification:
369126, 3242441
Abstract:
A property, such as a quality parameter, of a write pole in a write head is determined using an optical metrology device, where the write pole is smaller than the optical resolution limit of the metrology device. The metrology device produces polarized light that is reflected off the write pole while the write pole is magnetized either during or after excitation with a write current. The magnetization alters the polarization state of the light, which can be analyzed to transform the altered polarization state into intensity. The intensity of the light is detected over the point spread function of the optics in the metrology device and an intensity value is generated. The intensity value is used to determine the quality parameter of the write pole, e. g. , by comparison to a threshold or reference intensity value, which may be generated empirically or theoretically.

Testing Flex And Apfa Assemblies For Hard Disk Drives

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US Patent:
8536875, Sep 17, 2013
Filed:
Oct 12, 2010
Appl. No.:
12/902445
Inventors:
Wade A. Ogle - San Jose CA, US
Henry Patland - Los Gatos CA, US
Assignee:
Infinitum Solutions, Inc. - Santa Clara CA
International Classification:
G01R 31/02
US Classification:
324537, 32475401, 32476301, 324538
Abstract:
A tester for a testing a Hard Disk Drive (HDD) flex circuit prior to electrical installation of a Head Gimbal Assembly (HGA) includes a shorting block that makes electrical contact to the bondpads on the sample. The shorting block includes one or more electrical contacts that are electrically grounded and have a size and/or configuration to contact the bondpads as well as the surface of the sample around the bondpads to accommodate positioning tolerances of the sample under test, without need for optics, precise probes, or precision stages. The electrical contacts of the shorting block may be, e. g. , a matrix of pogopins or a flexible electrically-conductive material. During testing, the bondpads are shorted together and to ground with the shorting block while it is determined whether Short failures are properly detected. While the shorting block is not engaged with the bondpads, it is determined whether open failures are properly detected.

Magnetic Head Tester

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US Patent:
20030234646, Dec 25, 2003
Filed:
Jun 21, 2002
Appl. No.:
10/177333
Inventors:
Henry Patland - Los Gatos CA, US
Wade Ogle - San Jose CA, US
International Classification:
G01R033/12
US Classification:
324/210000, 324/212000
Abstract:
A magnetic head that includes a magnetoresistive effect read head element is tested by applying a varying magnetic field and measuring the resulting output signals from the read head element. The output signals are digitized and a processor calculates, e.g., the root mean square (RMS) of the signals or performs a Fast Fourier Transform or Autocorrelation on the data to determine if there is noise present. If desired, write and delay events may be performed prior to digitizing the output signals from the read head element to determine if additional noise, which is introduced to the magnetoresistive head from the write element, is present. In one embodiment, the digitizer may be replaced with an RMS meter.

Bar Level Lifecycle Analyzer

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US Patent:
20040207393, Oct 21, 2004
Filed:
Apr 17, 2003
Appl. No.:
10/418382
Inventors:
Henry Patland - Los Gatos CA, US
Wade Ogle - San Jose CA, US
International Classification:
G01R033/12
US Classification:
324/210000, 324/202000, 324/209000
Abstract:
A lifecycle analyzer includes a heating element for heating a plurality of magnetoresistive (MR) elements, which maybe, e.g., in bar form. At one location the MR elements are in contact with a stress probe card for applying a bias voltage or current stress. The MR elements are moved to a separate location, where there is a test probe card and magnetic field generator for testing the MR elements after being stressed. In one embodiment, a subset of the plurality of MR elements is tested at a time. The lifecycle analyzer includes an in-situ abrasive element that is used to abrade the probe pins of the stress probe card to remove oxidation that results from extended contact with the heated MR elements.

Read Sensor Testing Using Thermal Magnetic Fluctuation Noise Spectra

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US Patent:
20090147389, Jun 11, 2009
Filed:
Dec 10, 2007
Appl. No.:
11/953856
Inventors:
Alexander M. Taratorin - Sunnyvale CA, US
Henry Patland - Los Gatos CA, US
Wade A. Ogle - San Jose CA, US
Assignee:
Infinitum Solutions, Inc. - Santa Clara CA
International Classification:
G11B 27/36
US Classification:
360 31
Abstract:
A read head is tested by measuring the thermal magnetic fluctuation noise spectrum. A non-uniformity in the magnetic field of the free layer is produced and the thermal magnetic fluctuation noise spectrum is measured, with and/or without an external magnetic field applied. A peak in the thermal magnetic fluctuation noise spectrum can be used to derive the desired dimension of the free layer, such as track width and stripe height. The resulting measurement may then be fed back into the process control for the production of the read heads if desired. Additionally, the stiffness of the free layer and the strength of the reference layer may be determined using ferromagnetic resonance peaks in the thermal magnetic fluctuation noise spectrum.
Control profile
Henry A Patland from Napa, CA, age ~58 Get Report