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Cynthia B Whiteside

from Saint Johns, FL
Age ~65
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Also known as:
Cynthia A Whiteside, Cythia B Whiteside, Cynthia A Bianca, Cindy Whiteside
Related to:
Wanda Jean Barrett, 76Danny MckinzieRandy D CrowThereasa Mckinzie, 71Shahala D Greyard, 50
Connected to:
Alan K Whiteside, 57Albert N Whiteside, 77Amanda C Whitesides, 39Angela Whiteskunk, 38Anissa Whiteside, 32Appalania Whiteside, 39Barbie R Whiteside, 36Bianca L Whiteside, 31Brandon R Whiteside, 43Brooks E Whiteside, 80

Cynthia Whiteside Phones & Addresses

  • Saint Johns, FL
  • 395 Mountains Edge, Charlotte, VT 05445 (802) 425-4530
  • Modena, NY
  • Saint Albans, VT
  • Salt Lake City, UT

Resumes

Resumes

Cynthia Whiteside Photo 1

Rensselaer Polytechnic Institute

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Location:
395 Mountains Edge, Charlotte, VT 05445
Industry:
Semiconductors
Work:
Ibm 2005 - 2013
Mask Manufacturing Yield Program Manager
2005 - 2013
Rensselaer Polytechnic Institute
Education:
Rensselaer Polytechnic Institute
Masters, Chemistry
Skills:
Engineering Management
Yield Management
Process Improvement
Process Engineering
Lean Manufacturing
Lean Transformation
Program Management
Business Analysis
Analysis
Six Sigma
Yield
Manufacturing
Characterization
Business Process Improvement
Quality Management
Design of Experiments
Process Simulation
Spc
Cynthia Whiteside Photo 2

Cynthia Whiteside

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Cynthia Whiteside Photo 3

Cynthia Whiteside

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Publications

Us Patents

Photomask Image Inspection

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US Patent:
20090228228, Sep 10, 2009
Filed:
Mar 7, 2008
Appl. No.:
12/044032
Inventors:
Karen D. Badger - Milton VT, US
Jim B. Densmore - Morrisville VT, US
Christopher R. Gillman - Burlington VT, US
Kathleen G. Purdy - Richmond VT, US
Cynthia Whiteside - Charlotte VT, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G01N 37/00
US Classification:
702 83
Abstract:
A method optimizes photomask inspection. After masks are manufactured, the method predicts the likelihood that the masks will be defect free based on defect criteria, etch area, etch mode, and etch tool type associated with the masks. The method skips an initial mask inspection for masks that have a predictability value above a predetermined value and performs the initial mask inspection for masks that have a predictability value below the predetermined value. After initial inspection is preformed (or skipped), a pellicle is mounted on the mask and then all masks are inspected or reinspected for defects and foreign matter.
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Cynthia B Whiteside from Saint Johns, FL, age ~65 Get Report