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Corey L Bungay

from Ocoee, FL
Age ~54
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Also known as:
Corey Lee Bungay, Corey S Bungay
Phone and address:
3285 Fawnwood Dr, Ocoee, FL 34761
(407) 358-8615
Related to:
Deborah J Bungay, 56Bruce BungayKelli D Bungay, 54Kennedy Bungay, 28
Connected to:
David R Bungay, 90Jayne Bungay, 58Michael S Bungay, 47Richard W Bungay, 80Isabelo C Bungcayao, 90Ron B Bungcayao, 64Thed A Bungcayao, 52Andrew F Bunge, 69Carlos R Bunge, 35Dan C Bunge, 78

Corey Bungay Phones & Addresses

  • 3285 Fawnwood Dr, Ocoee, FL 34761 (407) 358-8615
  • 3821 Blackberry Cir, Lincoln, NE 68516 (402) 421-3318
  • 5847 91St St, Lincoln, NE 68526 (402) 421-3318 (402) 484-5085
  • Orlando, FL
  • Great Falls, MT
  • Box Elder, SD
  • Orange Pk, FL
  • Ellsworth AFB, SD
  • 3285 Fawnwood Dr, Ocoee, FL 34761

Education

Degree: Graduate or professional degree

Emails

c***[email protected]

Publications

Us Patents

Sample Analysis Methodology Utilizing Electromagnetic Radiation

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US Patent:
7385697, Jun 10, 2008
Filed:
May 20, 2004
Appl. No.:
10/849740
Inventors:
John A. Woollam - Lincoln NE, US
Corey L. Bungay - Lincoln NE, US
Thomas E. Tiwald - Lincoln NE, US
Martin M. Liphardt - Lincoln NE, US
Ronald A. Synowicki - Lincoln NE, US
Gregory K. Pribil - Lincoln NE, US
Craig M. Herzinger - Lincoln NE, US
Blaine D. Johs - Lincoln NE, US
James N. Hilfiker - Lincoln NE, US
Assignee:
J.A. Woollam Co., Inc. - Lincoln NE
International Classification:
G01J 4/00
US Classification:
356369
Abstract:
Simultaneous use of wavelengths in at least two ranges selected from RADIO, MICRO, FIR, IR, NIR-VIS-NUV, UV, DUV, VUV EUV, XRAY in a regression procedure to evaluate parameters in mathematical dispersion structures to model dielectric functions.

Sample Masking In Ellipsometer And The Like Systems Including Detection Of Substrate Backside Reflections

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US Patent:
7477388, Jan 13, 2009
Filed:
May 24, 2006
Appl. No.:
11/439491
Inventors:
Martin M. Liphardt - Lincoln NE, US
James D. Welch - Omaha NE, US
Corey L. Bungay - Lincoln NE, US
John A. Woollam - Lincoln NE, US
Assignee:
J.A. Woollam Co., Inc. - Lincoln NE
International Classification:
G01J 4/00
US Classification:
356364, 356638, 356369
Abstract:
A system and method of preventing substrate backside reflected components in a beam of electromagnetic radiation caused to reflect from the surface of a sample in an ellipsometer or polarimeter system, involving placing a mask adjacent to the surface of the sample which allows electromagnetic radiation to access the sample over only a limited area, wherein the mask can include detector elements for collecting electromagnetic radiation reflected from the sample backside.

Method For Evaluating Sample System Anisotropic Refractive Indices And Orientations Thereof In Multiple Dimensions

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US Patent:
6441902, Aug 27, 2002
Filed:
Dec 29, 1999
Appl. No.:
09/474318
Inventors:
James N. Hilfiker - Lincoln NE
Corey L. Bungay - Lincoln NE
Craig M. Herzinger - Lincoln NE
Assignee:
J. A. Woollam Co. Inc. - Lincoln NE
International Classification:
G01J 400
US Classification:
356369, 250225
Abstract:
Disclosed is a method of evaluating sample system anisotropic refractive indices, and orientations thereof with respect to an alignment surface, in multiple dimensions. The preferred method involves a sequence of steps which allows overcoming mathematical model parameter correlation during mathematical regression parameter evaluation, even though individually, steps of the present invention method wherein anisotropic refractive indices, or differences therebetween, are evaluated, require that only a relatively simple one dimensional data set be acquired.
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Corey L Bungay from Ocoee, FL, age ~54 Get Report