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Colin Ophus Phones & Addresses

  • Berkeley, CA

Work

Company: Lawrence berkeley national laboratory Jun 2012 Address: National Center for Electron Microscopy, LBNL, Berkeley, CA Position: Staff scientist

Education

Degree: PhD School / High School: University of Alberta 2006 to 2010 Specialities: Materials Engineering

Skills

Nanotechnology • Materials Science • Electron Microscopy • Thin Films • Scanning Electron Microscopy • Characterization • Powder X Ray Diffraction • Afm • Microscopy • Spectroscopy • Mems • Photolithography • Tem • Nanofabrication • Experimentation • Electrochemistry • Optical Microscopy • Sputtering • Microfabrication • Microfluidics • Transmission Electron Microscopy

Industries

Research

Resumes

Resumes

Colin Ophus Photo 1

Staff Scientist At Lawrence Berkeley National Lab

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Location:
Berkeley, CA
Industry:
Research
Work:
Lawrence Berkeley National Laboratory - National Center for Electron Microscopy, LBNL, Berkeley, CA since Jun 2012
Staff Scientist

Lawrence Berkeley National Laboratory Apr 2010 - May 2012
Materials Postdoctoral Fellow
Education:
University of Alberta 2006 - 2010
PhD, Materials Engineering
University of Alberta 2001 - 2005
BSc, Engineering Physics
Skills:
Nanotechnology
Materials Science
Electron Microscopy
Thin Films
Scanning Electron Microscopy
Characterization
Powder X Ray Diffraction
Afm
Microscopy
Spectroscopy
Mems
Photolithography
Tem
Nanofabrication
Experimentation
Electrochemistry
Optical Microscopy
Sputtering
Microfabrication
Microfluidics
Transmission Electron Microscopy

Publications

Us Patents

Micro/Nano Devices Fabricated From Cu-Hf Thin Films

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US Patent:
20120011624, Jan 12, 2012
Filed:
Mar 25, 2011
Appl. No.:
13/072343
Inventors:
Erik J. LUBER - Edmonton, CA
Colin OPHUS - Berkeley CA, US
David MITLIN - Edmonton, CA
Brian OLSEN - Edmonton, CA
Christopher HARROWER - Edmonton, CA
Velimir RADMILOVIC - Berkeley CA, US
Assignee:
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA - Berkeley CA
THE GOVERNORS OF THE UNIVERSITY OF ALBERTA - Edmonton
International Classification:
G01Q 60/38
US Classification:
850 40
Abstract:
An all-metal microdevice or nanodevice such as an atomic force microscope probe is manufactured from a copper-hafnium alloy thin film having an x-ray amorphous microstructure.
Colin Ophus from Berkeley, CA, age ~40 Get Report