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Christie G Enke

from Albuquerque, NM
Age ~91

Christie Enke Phones & Addresses

  • 10501 Lagrima De Oro Rd NE APT 380, Albuquerque, NM 87111 (505) 867-3131
  • Placitas, NM
  • East Lansing, MI
  • Okemos, MI
  • Topeka, KS
  • 33 Vista De Oro, Placitas, NM 87043 (505) 867-3131

Publications

Isbn (Books And Publications)

The Art and Science of Chemical Analysis

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Author

Christie G. Enke

ISBN #

0471373699

The Art and Science of Chemical Analysis

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Author

Christie G. Enke

ISBN #

0471391379

The Art and Science of Chemical Analysis

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Author

Christie G. Enke

ISBN #

0471417718

Digital and Analog Data Conversions: Text with Experiments

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Author

Christie G. Enke

ISBN #

0805369058

Microcomputers and Electronic Instrumentation: Making the Right Connections

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Author

Christie G. Enke

ISBN #

0841228612

Us Patents

Resistive Stabilization Of The Electrospray Ionization Process

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US Patent:
6452166, Sep 17, 2002
Filed:
Apr 19, 2000
Appl. No.:
09/552646
Inventors:
Christie G. Enke - Albuquerque NM
George S. Jackson - Albuquerque NM
Assignee:
University of New Mexico - Albuquerque NM
International Classification:
H01J 3700
US Classification:
250288, 250423 R
Abstract:
An electrical equivalent circuit is provided for an electrospray process. It is a series circuit which includes a power supply voltage (V ), a voltage (V ) established at the electrochemical contact to the solution, a solution resistance (R ), a constant current regulator which represents the processes of charge separation and charge transport in the gap between the spray needle aperture and the counter electrode, and a voltage (V ) caused by charge neutralization at the counter electrode. A current i, established by the constant current regulator flows throughout the entire circuit. Current-voltage curves are developed for each part of the circuit. From these it is shown that in the case where R is negligible (the power supply is connected directly to a conducting needle) the shape of the current-voltage curve is dictated by the constant current regulator established by the charge separation process, the gap, and the counter electrode. The solution resistance is significant if a non-conducting needle is used so that the electrochemical contact to the solution is remote from the tip. The high series resistance acts to stabilize the operation of an electrospray ionization device enabling operation over a wider range of experimental conditions than without it.

Ion Mirror

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US Patent:
6518569, Feb 11, 2003
Filed:
Jun 9, 2000
Appl. No.:
09/591536
Inventors:
Jun Zhang - Albuquerque NM
Benjamin D. Gardner - Albuquerque NM
Christie G. Enke - Albuquerque NM
Assignee:
Science Technology Corporation UNM - Albuquerque NM
International Classification:
H01J 4900
US Classification:
250287, 250396 R
Abstract:
Novel ion mirrors comprising, in a preferred embodiment, three cylinders, rectangles or truncated cones to improve the resolving power in the time-of-flight mass spectrometers over broad ion kinetic energy ranges. The achieved electric field is non-linear along the mirror axis and relatively homogeneous in the mirror off-axis directions. Combined with dimension optimization, in a preferred embodiment, the adjustment of only two parameters of element voltages can yield preferred electric field distribution to fit different ion optical systems.

Distance Of Flight Spectrometer For Ms And Simultaneous Scanless Ms/Ms

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US Patent:
7041968, May 9, 2006
Filed:
Mar 18, 2004
Appl. No.:
10/804968
Inventors:
Christie G. Enke - Placitas NM, US
Assignee:
Science & Technology Corporation @ UNM - Albuquerque NM
International Classification:
H01J 49/40
US Classification:
250282, 250281, 250287
Abstract:
A distance of flight (DOF) approach to mass spectrometry in which the resolution among the various ion masses is accomplished in space rather than time. A separate detector is associated with each ion mass resolution element. The DOF mass spectrometer can serve as one element in a tandem arrangement which has the capability to produce a full two-dimensional precursor/product spectrum for each bunch of ions extracted from the source. A “distance-of-flight” (DOF) mass analyzer is used in combination with time-of-flight (TOF) mass analysis for precursor and product dispersion. All the precursor ions can undergo a mass changing reaction simultaneously, while still retaining the essential information about the particular precursor m/z value from which each product ion m/z value emanated. Through the use of a two-dimensional detector, all the products ions from all the precursors can be detected for each batch of ions analyzed.

Distance Of Flight Spectrometer For Ms And Simultaneous Scanless Ms/Ms

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US Patent:
7429728, Sep 30, 2008
Filed:
Feb 23, 2006
Appl. No.:
11/360872
Inventors:
Christie G. Enke - Placitas NM, US
Assignee:
STC.UNM - Albuquerque NM
International Classification:
H01J 49/40
US Classification:
250282, 250281, 250287
Abstract:
A distance of flight (DOF) approach to mass spectroscopy in which the resolution among the various ion masses is accomplished in space rather than time. A separate detector is associated with each ion mass resolution element. The DOF mass spectrometer can serve as one element in a tandem arrangement which has the capability to produce a full two-dimensional precursor/product spectrum for each bunch of ions extracted from the source. A “distance-of-flight” (DOF) mass analyzer is used in combination with time-of-flight (TOF) mass analysis for precursor and product dispersion. All the precursor ions can undergo a mass changing reaction simultaneously, while still retaining the essential information about the particular precursor m/z value from which each product ion m/z value emanated. Through the use of a two-dimensional detector, all the products ions from all the precursors can be detected for each batch of ions analyzed.

Energy Focus For Distance Of Flight Mass Spectometry With Constant Momentum Acceleration And An Ion Mirror

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US Patent:
7947950, May 24, 2011
Filed:
Oct 2, 2007
Appl. No.:
11/865812
Inventors:
Christie G Enke - Placitas NM, US
Gareth S Dobson - Burlingame CA, US
Assignee:
STC.UNM - Albuquerque NM
International Classification:
H01J 49/06
G01N 27/62
US Classification:
250290, 250281, 250282, 250288, 250291
Abstract:
A distance-of-flight mass spectrometer (DOF-MS) imparts constant momentum acceleration to ions in an ion source and uses an ion mirror to enhance energy focusing. Embodiments of DOF-MS with ion mirror are shown. Further, a method of compensating for the dispersion of initial ion position and velocity in the ion source is discussed.

Ion Focusing And Detection In A Miniature Linear Ion Trap For Mass Spectrometry

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US Patent:
7960692, Jun 14, 2011
Filed:
May 24, 2007
Appl. No.:
11/753455
Inventors:
Gareth S. Dobson - Albuquerque NM, US
Christie G. Enke - Placitas NM, US
Assignee:
STC.UNM - Albuquerque NM
International Classification:
H01J 49/26
H01J 49/40
US Classification:
250283, 250281, 250282, 250287
Abstract:
A miniature linear ion trap (MLIT) with a length of less than 30 mm is provided for ion focusing in the axial plane. The MLIT has multipoles for applying an AC voltage to ions and tubular entrance and exit lenses for applying a DC voltage to the ions. In another aspect, MLIT includes electrodes within the tubular entrance and exit lenses for detection of image current. A method is also provided for applying voltage to the entrance and exit lenses for ion focusing.

Enhancement Of Concentration Range Of Chromatographically Detectable Components With Array Detector Mass Spectrometry

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US Patent:
8378296, Feb 19, 2013
Filed:
Apr 5, 2011
Appl. No.:
13/080392
Inventors:
Christie Enke - Placitas NM, US
Assignee:
STC.UNM - Albuquerque NM
International Classification:
B01D 59/44
H01J 49/00
US Classification:
250288, 250281, 250282, 250284, 250286
Abstract:
Methods and instruments for high dynamic range analysis of sample components are described. A sample is subjected to time-dependent separation, ionized, and the ions dispersed with a constant integration time across an array of detectors according to the ions m/z values. Each of the detectors in the array has a dynamically adjustable gain or a logarithmic response function, producing an instrument capable of detecting a ratio of responses or 4 or more orders of magnitude.

Method For Enhancement Of Mass Resolution Over A Limited Mass Range For Time-Of-Flight Spectrometry

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US Patent:
8604423, Dec 10, 2013
Filed:
Apr 5, 2011
Appl. No.:
13/639257
Inventors:
Christie G. Enke - Placitas NM, US
Steven J. Ray - Bloomington IN, US
Alexander W. Graham - Bloomington IN, US
Gary M. Hieftje - Bloomington IN, US
Elise Dennis - Bloomington IN, US
Charles J. Barinaga - West Richland WA, US
David W. Koppenaal - Richland WA, US
Assignee:
Indiana University Research and Technology Corporation - Indianapolis IN
Battelle Memorial Institute - Richland WA
International Classification:
H01J 49/26
H01J 49/40
B01D 59/44
US Classification:
250287, 250281, 250282, 250288, 31511161, 31511181
Abstract:
Novel methods and instrumentation for mass spectrometry are described. Zoom-time of flight mass spectrometry (Zoom-TOF) allows increased mass resolution over a pre-determined specific range of masses. Methods for retrofitting traditional time-of-flight (TOF) and distance of flight (DOF) mass spectrometers are described, as well as novel instruments capable of performing Zoom-TOF analyses.

Wikipedia References

Christie Enke Photo 1

Christie G . Enke

About:
Known for:

Electrospray ionization
Mass Spectrometry

Work:
Position:

Chemist

Company:

University of New Mexico

Education:
Studied at:

University of Illinois

Specialty:

Chemist

Christie Enke Photo 2

Christie G. Enke

Christie G Enke from Albuquerque, NM, age ~91 Get Report