Inventors:
Moises Cases - Austin TX, US
Daniel N. de Araujo - Cedar Park TX, US
Bradley D. Herrman - Cary NC, US
Erdem Matoglu - Austin TX, US
Bhyrav M. Mutnury - Austin TX, US
Pravin Patel - Cary NC, US
Nam H. Pham - Round Rock TX, US
Assignee:
International Business Machines Corporation - Armonk NY
International Classification:
G11C 29/00
US Classification:
714718, 714 5, 714 25, 714 42, 714 43, 714 56, 714704, 714712, 365201, 702 38
Abstract:
The present invention assesses memory (DIMM) strength by calculating frequency content of a radiated field which is collected by an apparatus, such as a dipole antenna. Radiated field is created by accelerated charge, which is a function of the slew rate or DIMM strength. Radiated power is directly proportional to the frequency at which bits are driven. By separating the radiated field from the near field or stored field, the DIMM strength content is isolated from other functional DIMM issues, such as tRCD latency, refresh cycles, addressing mode, etc. By examining the radiated power, the disadvantages of the prior art, such as by probing the DIMM's contacts, are avoided.