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Bob B He

from Hercules, CA
Age ~69
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Also known as:
Bob Baoping He, Baoping B He, Robert B He, Bobby B He, Rodney Sergent, Bob E, He Baoping
Related to:
Rickey Sergent, 68Robert Barnes, 56Susan Griffin, 49Pattie Kays, 65James Barnes, 90Steven Barnes, 71
Connected to:
Anatola S He, 33Ann He, 33Bei He, 33Beidi He, 37Betty H He, 71Bowen He, 33Changming He, 29Chansheng He, 65Chu He, 51Deric J He, 50

Bob He Phones & Addresses

  • Hercules, CA
  • 6509 Appleglen Ln, Madison, WI 53719 (608) 848-4101 (608) 848-4102
  • 7425 Valley Ridge Rd, Madison, WI 53719 (608) 276-9759
  • New York, NY
  • Baxter, KY
  • Ypsilanti, MI
  • Blacksburg, VA
  • Arlington, VA

Resumes

Resumes

Bob He Photo 1

Director Of Innovation And Business Development

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Location:
San Francisco, CA
Industry:
Electrical/Electronic Manufacturing
Work:
Indian Institute of Technology, Kharagpur Jun 2012 - Jun 2015
Distinguished Visiting Professor
Bruker Axs Jun 2012 - Jun 2015
Director of Innovation and Business Development
Bruker Axs 1996 - Sep 2009
Director of R and D and Engineering
Education:
Virginia Tech 1986 - 1992
Doctorates, Doctor of Philosophy, Materials Science, Philosophy
Skills:
Materials Science
R&D
X Ray
Nanotechnology
Powder X Ray Diffraction
Characterization
Semiconductors
Thin Films
Product Development
Spectroscopy
Research
Physics
Nanomaterials
Science
Product Management
Optics
Xrf
Materials
Analytical Chemistry
Competitive Analysis
Business Development
Engineering
Design of Experiments
Research and Development
Project Management
X Ray Crystallography
Inorganic Chemistry
Polymers
Marketing Strategy
Instrumentation
Coatings
Interests:
Human Rights
Science and Technology
Languages:
English
Mandarin
Bob He Photo 2

Sales Manager

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Work:
Xcmg Imp. & Exp. Co., Ltd
Sales Manager
Bob He Photo 3

Bob He

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Bob He Photo 4

Bob He

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Bob He Photo 5

Bob He

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Location:
United States
Bob He Photo 6

Owner, Heaps Elec Technology

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Location:
San Francisco Bay Area
Industry:
Design
Bob He Photo 7

Bob He

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Business Records

Name / Title
Company / Classification
Phones & Addresses
Bob He
Director Of Research And Development
Bruker AXS
Electrical/Electronic Manufacturing · Mfg X-Ray Apparatus/Tubes · Mfg Analytical Instruments
5465 E Cheryl Pkwy, Madison, WI 53711
40 Manning Rd, Billerica, MA 01821
Madison, WI 53711
(608) 276-3000, (608) 276-3006, (608) 276-3020, (608) 276-3809

Publications

Us Patents

Non-Spilling Cryogenic Transfer Vial For Crystal Sample Mounting

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US Patent:
6701743, Mar 9, 2004
Filed:
Dec 3, 2001
Appl. No.:
10/005504
Inventors:
Roger D. Durst - Middleton WI
Bob Baoping He - Madison WI
Stephen I. Foundling - Verona WI
Max Li - Platteville WI
Assignee:
Bruker AXS, Inc. - Madison WI
International Classification:
F25B 2100
US Classification:
624579, 62371
Abstract:
A cryogenic transfer vial for storing and loading a crystal sample on a goniometer includes a cryogen retainer that inhibits spillage of the cryogen when the vial is inverted during sample loading and retrieval. The retainer may be an adsorptive material located in a region of the vial near a sample location, or may be a baffle arrangement within the vial for containing the cryogen.

X-Ray Diffraction Screening System With Retractable X-Ray Shield

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US Patent:
6718008, Apr 6, 2004
Filed:
Apr 22, 2002
Appl. No.:
10/127352
Inventors:
Bob Baoping He - Madison WI
Frank Feng Jin - Fitchburg WI
Assignee:
Bruker AXS, Inc. - Madison WI
International Classification:
G01N 2320
US Classification:
378 71, 378206
Abstract:
An x-ray diffraction analysis system provides the automated x-ray diffraction analysis of a plurality of samples in a multiple-cell sample holder. The system includes x-ray source, a detector, a movable sample support and a retractable x-ray shield. The retractable shield is movable between a retracted position, in which optical positioning equipment may be used to locate each sample in the proper testing position, and an extended position, in which stray x-ray energy is blocked. The x-ray energy blocked by the shield includes x-rays diffracted from samples closer to the x-ray source than the sample under test, and x-rays from the source directed toward samples further from the source than the sample under test. Automated movement of the sample support and shield allows for an automated routine to sequentially position each sample, move the shield into the extended position and perform the desired analysis.

Diffraction System For Biological Crystal Screening

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US Patent:
6836532, Dec 28, 2004
Filed:
Apr 9, 2002
Appl. No.:
10/118981
Inventors:
Roger D. Durst - Middleton WI
Bob Baoping He - Madison WI
Assignee:
Bruker AXS, Inc. - Madison WI
International Classification:
G01N 23207
US Classification:
378 73, 378 71, 378 79, 378 80, 378208, 117 14, 117 69, 117 85, 117201, 117206
Abstract:
A biological crystal formation screening apparatus uses an x-ray diffraction technique to analyze the sample containers of a sample tray for the presence of crystal formation. An x-ray source is directed toward a sample under investigation, and a two-dimensional x-ray detector is located to receive any diffracted x-ray energy. A positioning apparatus allows the different sample containers of a tray to be sequentially aligned with the source and detector, allowing each to be examined. The sample container is arranged such that a sample is located relative to the well solution so that the x-ray beam is directed to the sample without being incident on the well solution.

Transmission Mode X-Ray Diffraction Screening System

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US Patent:
6859520, Feb 22, 2005
Filed:
Mar 20, 2003
Appl. No.:
10/393441
Inventors:
Bob Baoping He - Madison WI, US
Ryan C. Bollig - Marshall WI, US
Hans Mathias Lutz Brügemann - Durmersheim, DE
Assignee:
Bruker AXS, Inc. - Madison WI
International Classification:
G01N023/20
US Classification:
378 79, 378 81, 378 71
Abstract:
A transmission mode x-ray diffraction screening system has a sample support that holds a sample tray with multiple samples to be tested. The sample support is connected to a translation stage that is movable in three dimensions, and that it offset from the location of the sample support. An x-ray source is located to one side of the sample support, and a detector is located to the other side, thereby allowing the detection of x-rays that are diffracted by the sample in a transmission mode. A retractable beamstop may be located between the sample and the detector to block at least part of the non-diffracted x-rays from the source. A video camera may also be provided for imaging the sample location, which may be illuminated by a laser. The entire system may be automated such that each sample in the sample tray may be sequentially analyzed.

Vertical Small Angle X-Ray Scattering System

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US Patent:
6956928, Oct 18, 2005
Filed:
May 5, 2003
Appl. No.:
10/429926
Inventors:
Bob Baoping He - Madison WI, US
Rolf Dieter Schipper - Karlsruhe, DE
Assignee:
Bruker AXS, Inc. - Madison WI
International Classification:
G01N023/201
US Classification:
378 87, 378 70, 378 71, 378 80, 378 86, 378 89
Abstract:
A small angle x-ray diffraction scattering system has a vertical orientation, allowing for simplified analysis of liquid samples. The system may function in a beam-up or a beam-down configuration. An x-ray source provides an initial x-ray beam that is directed vertically along a primary beampath to a sample located on a sample support. The small angle scattered x-ray energy travels through a secondary beampath to a detector. The primary and secondary beampaths may be evacuated and separated from a sample chamber by fluid seals. Beam conditioning optics and a collimator may be used in the primary beampath, and a beamstop used in the secondary beampath. The sample chamber may have a microscope or camera, which may be movable, for observing the sample, and a translation stage for moving the sample in at least two dimensions.

Scanning Line Detector For Two-Dimensional X-Ray Diffractometer

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US Patent:
7190762, Mar 13, 2007
Filed:
Oct 29, 2004
Appl. No.:
10/977251
Inventors:
Bob Baoping He - Madison WI, US
Assignee:
Broker AXS, Inc - Madison WI
International Classification:
G01N 23/20
US Classification:
378 70, 378 71
Abstract:
A scanning line detector according to the present invention uses a detector with a linear arrangement of detection elements that is moved along a range of diffracted x-ray directions to collect data across a multidimensional detection area. The scanning line detector allows for the simulation of a two-dimensional detector system without the need for a two-dimensional detector. The detector may follow a desired path to simulate a desired shape, such as a cylinder. A slit may be included to limit the detector line width, and a scatter shield may be used to minimize noise from air-scattered x-rays. The detector may also use a specially designed monochromator for conditioning the diffracted x-rays. The detector may be rotatable about an axis parallel to a direction along which x-rays are diffracted, allowing it to be used in different orientations.

X-Ray Diffraction Screening System Convertible Between Reflection And Transmission Modes

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US Patent:
7242745, Jul 10, 2007
Filed:
Jul 19, 2005
Appl. No.:
11/184551
Inventors:
Bob Baoping He - Madison WI, US
Ryan C. Bollig - Marshall WI, US
International Classification:
G01N 23/20
US Classification:
378 81
Abstract:
An X-ray diffraction apparatus provides analysis in either transmission or reflective mode and easy conversion between the two modes. An X-ray source and X-ray detector are each connected to a different circle of a goniometer. The two circles may be rotated independently to position the source and detector on the same side of a sample library for reflection mode operation, or on opposite sides of the sample library for transmission mode operation. The sample library has a horizontal orientation that allows open sample containers of the library to maintain the sample without spillage, and it connects to an XYZ stage that can move in three dimensions. The system may use a beamstop, and the goniometer and XYZ stage be motorized and controlled for automated sample analysis.

Multiple-Position X-Ray Tube For Diffractometer

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US Patent:
7248672, Jul 24, 2007
Filed:
Apr 21, 2005
Appl. No.:
11/111497
Inventors:
Roger D. Durst - Middleton WI, US
Bob Baoping He - Madison WI, US
Assignee:
Bruker AXS, Inc. - Madison WI
International Classification:
H01J 35/00
H05G 1/02
US Classification:
378121, 378119, 378193, 378197
Abstract:
An x-ray source provides both a line focus output and a point focus output, and is mounted on a rotatable support to allow easy changing between the two. A housing has ports at different angular positions relative to an anode, and each port has an associated optic appropriate for an x-ray beam passing through that port. Three or four ports may also be used to allow for different types of beam conditioning. The different beam optics may also do conditioning based on wavelength, and the anode may be of a composite material to provide different wavelength ranges. The rotatable support may be manual or motorized, and a lockout mechanism may be used to ensure that only one port is active at a time. The support may also be located on a movable table that is movable in multiple perpendicular directions.
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Bob B He from Hercules, CA, age ~69 Get Report